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Assoc. Prof. Dr. Vahid Garousi is at Bilkent Mobile Days (IEEE Student Branch): A Review of Automated Test Cost-Effectiveness and Defect Density in the Android Platform

Mobile Days

The Bilkent IEEE Student Branch will hold Mobile Days on the 4th, 5th and 6th April 2014 for the second time. Mobile Days will inform you about new trends, provide you with the opportunity to learn how to develop mobile applications and bring you together with famous speakers from mobile sector together.

Registration: http://ieee.bilkent.edu.tr/mobilgunler/en/index-2.html

A Review of Automated Test Cost-Effectiveness and Defect Density in the Android Platform

Saturday, April 5, 2014, 10:25am – 11:10am
Presented by Vahid Garousi
Located in FFB-22
In track Session A

The Android operating system is one of the most popular open-source platforms in the mobile operating system market. There has been little research on test coverage and test cost-effectiveness in this platform. The goal of this talk is to present results from a recent study in which we assessed test coverage, fault detection effectiveness, test cost-effectiveness and defect density in code-base of version 2.1 of the Android platform. Results of our study will help us and other researchers to get a better view on test coverage, fault detection effectiveness, test cost-effectiveness and defect density in Android code-base.